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                    Optical  Access Test Implementation Liaison Committee of HATS Conference schedules a  series of interoperability tests specifically for IEEE 1904.1 SIEPON Package B  compliant 10G-EPON equipment, corresponding to approval both of IEEE  1904.1/Conformance and ITU-T G.9801 Implementers’ guide which are standards for  test procedures for 10G-EPON. 
                    These  tests verify a data communication channel establishment, normality of both for  unicast and broadcast data transmission, encrypted data transmission and eOAM  sequence and message format under a condition that a single ONU or multiple  ONUs are connected to the OLT. Your active participation will be greatly  appreciated. 
                    When  your company is willing to participate in the 4th 10G-EPON equipment  interoperability test, please send an e-mail for your registration request to  our secretariat (please see below “3. Contact information”) with filling the  listed “2. Required information” no later than Monday, Feb. 23, 2015. 
1.10G-EPON equipment interoperability test outline 
| (1)  | 
Test  schedule | 
 
|   | 
Mar. 5 (Thu.) –6 (Fri.), 2015   | 
 
| (2)  | 
Venue | 
 
|   | 
CIAJ (Communications and Information network  Association of Japan) 
3rd Fl., JEI Hamamatsucho Bldg., 
2-2-12 Hamamatsucho, Minato-ku, 
Tokyo 105-0013  | 
 
| (3)  | 
Equipment under test | 
 
|   | 
1) IEEE 1904.1 SIEPON Package B compliant 10G-EPON OLT Equipment 
2) IEEE 1904.1 SIEPON Package B compliant 10G-EPON ONU Equipment 
(You can bring either or both.)  | 
 
| (4)  | 
Abstract  of testing | 
 
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The test is in principle performed in a  round-robin system for all participating equipment. 
The test is performed based on  “Interoperability Test Guideline for Optical Access Network Devices  (HATS-JE-105-V1.3)” published on Dec. 25, 2014 by HATS Steering  Committee. 
The test focuses on items relating to a data  communication channel establishment, normality of both for unicast and  broadcast data transmission, encrypted data transmission and eOAM sequence and  message format under a condition that a single ONU or multiple ONUs are  connected to the OLT. Test procedure is available from the following. 
URL  (http://www.ciaj.or.jp/hats/english/guideline.html) | 
 
| (5)  | 
Notes | 
 
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1) Company  who plans to bring multiple types of devices is requested to enlist sufficient  number of support engineers to perform concurrent tests of all the devices. 
2) IEEE 1904.1 SIEPON Package B specification  is available from the following. 
URL (http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6605488) 
3) For Optical  Access Test Implementation Liaison Committee members, the registration for this  test is free of charge. All others will require another procedure. Please  contact the secretariat for more information. | 
 
| (6)  | 
Pre-briefing | 
 
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Pre-briefing will be held as follows. Strongly suggest an active participation for those who have interest in the test. 
Schedule: 15:00-17:00, Monday, Feb. 16, 2015 
Location: Meeting room F&G at CIAJ (Communications and Information network Association of Japan)  | 
 
 
2.Required information 
- Company:
 
- Division:
 
- Applicant:
 
- Contact information:
 
 
Please inform specification of your  equipment by filling the attached form “equipment list “. One list is required  per model. 
[Survey] HATS conference is planning a  10G-EPON show case based on this interoperability test at CEATEC JAPAN 2014.  Please inform whether you can participate in the show case with your equipment. 
 Will participate   May participate 
 Probably not   Unknown / Not yet decided  
3.Contact information 
- Secretariat: Mr. Otsubo and Ms. Ogata
 
- CIAJ (Communications and Information network Association of Japan)
 
- E-Mail: jisshi-hikari[at]ciaj.or.jp
 
- Registration deadline: Monday, Feb. 23, 2015
 
 
4.The interoperability tests of IEEE 1904.1 SIEPON Package B compliant 10G-EPON equipment list 
*We accepts your participation at any time in the Liaison Committees and the Ad-hoc WG. Please contact our secretariat for more details. 
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